Effect of collisions on the angular distribution of ions under plasmachemical etching


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Abstract

The most important parameter responsible for the quality of high-aspect structures produced by plasmachemical etching is the angular distribution of ions near the processed surface. In this work, the effect of collisions and gas pressure on the angular distributions of ions and chemically active radicals in the chamber of a high-pressure plasmachemical reactor with a remote plasma source is analyzed theoretically.

About the authors

Yu. N. Devyatko

National Research Nuclear University “MEPhI,”; Institute of Physics and Technology

Author for correspondence.
Email: ydevyatko@mail.ru
Russian Federation, Moscow, 115409; Moscow, 117218

A. V. Fadeev

Institute of Physics and Technology

Email: ydevyatko@mail.ru
Russian Federation, Moscow, 117218

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