Frequency Effects on Helium–Oxygen Dielectric Barrier Discharges from Multibreakdowns to Single Breakdown per Half-Cycle
- Autores: Guo Y.1, Zhang H.1, E J.L.1
- 
							Afiliações: 
							- School of Electrical Engineering, Xi’an Jiaotong University
 
- Edição: Volume 45, Nº 11 (2019)
- Páginas: 1053-1058
- Seção: Low-Temperature Plasma
- URL: https://journal-vniispk.ru/1063-780X/article/view/187249
- DOI: https://doi.org/10.1134/S1063780X19100040
- ID: 187249
Citar
Resumo
In this work, a one-dimensional fluid model is established to study the effects of frequency on (He + O2) dielectric barrier discharge. As the frequency increases from 20 to 30 kHz, the first pulse becomes more intensive, while the second pulse gradually decreases and finally disappears. The plasma transforms from multibreakdowns to single breakdown per half-cycle. In order to study the production of reactive oxygen species (ROS) during this transformation, the spatiotemporal distributions of ROS densities are presented and the average ROS densities, as well as their wall fluences, are statistically analyzed. It is suggested that the production of each species increases along with the frequency, but when the second pulse disappears, the productions of some species, such as \({{{\text{O}}}^{ - }}\) and \({\text{O}}_{2}^{ * }\), decline slightly. Moreover, the wall fluence and average density of a specific species vary with similar trends.
Sobre autores
Y. Guo
School of Electrical Engineering, Xi’an Jiaotong University
														Email: mhzhang@mail.xjtu.edu.cn
				                					                																			                												                	República Popular da China, 							Xi’an						
H. Zhang
School of Electrical Engineering, Xi’an Jiaotong University
							Autor responsável pela correspondência
							Email: mhzhang@mail.xjtu.edu.cn
				                					                																			                												                	República Popular da China, 							Xi’an						
J. E
School of Electrical Engineering, Xi’an Jiaotong University
														Email: mhzhang@mail.xjtu.edu.cn
				                					                																			                												                	República Popular da China, 							Xi’an						
Arquivos suplementares
 
				
			 
						 
						 
						 
						 
					 
				 
  
  
  
  
  Enviar artigo por via de e-mail
			Enviar artigo por via de e-mail  Acesso aberto
		                                Acesso aberto Acesso está concedido
						Acesso está concedido Somente assinantes
		                                		                                        Somente assinantes
		                                					