Informaçao sobre o Autor
Egorov, E. V.
| Edição | Seção | Título | Arquivo |
| Volume 59, Nº 4 (2017) | Phase Transitions | Structural heteroepitaxy during topochemical transformation of silicon to silicon carbide | |
| Volume 61, Nº 12 (2019) | Surface Physics and Thin Films | Ion-Beam and X-Ray Methods of Elemental Diagnostics of Thin Film Coatings |