作者的详细信息
Beisenkhanov, N. B.
| 期 | 栏目 | 标题 | 文件 |
| 卷 59, 编号 5 (2017) | Surface Physics, Thin Films | X-ray reflectometry and simulation of the parameters of SiC epitaxial films on Si(111), grown by the atomic substitution method | |
| 卷 61, 编号 12 (2019) | Surface Physics and Thin Films | Low-Temperature Synthesis of α-SiC Nanocrystals |