Автор туралы ақпарат

Kyutt, R. N.

Шығарылым	Бөлім	Атауы	Файл
Том 58, № 6 (2016)	Semiconductors	On the role of secondary extinction in the measurement of the integrated intensity of X-ray diffraction peaks and in the determination of the thickness of damaged epitaxial layers
Том 59, № 10 (2017)	Atomic Clusters	On magnetism of nickel clusters in nanoporous carbon
Том 60, № 4 (2018)	Semiconductors	Intensity Distribution of the Three-Wave Diffraction from Dislocation Epitaxial Layers in the Reciprocal Space