Impact of the Field of a Magnetic Force Microscope Probe on the Skyrmion State in a Modified Co/Pt Film with Perpendicular Anisotropy


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Аннотация

We present the results of experiments on the local magnetization reversal of artificial magnetic skyrmions in a Co/Pt multilayer film with a perpendicular magnetization by a magnetic force microscope (MFM) probe. The sample was a Co/Pt film containing an array of cylindrical regions with reduced anisotropy, modified by a focused He+ ion beam. The magnetic state of the sample was monitored by magnetic force microscopy. The magnetization reversal was performed by the MFM probe field during passes over the sample at low altitudes. The effects of the interaction of the field of the MFM probe with the skyrmion state of magnetization in these structures are investigated by micromagnetic simulation.

Авторлар туралы

V. Mironov

Institute for Physics of Microstructures, Russian Academy of Sciences

Хат алмасуға жауапты Автор.
Email: mironov@ipmras.ru
Ресей, Nizhny Novgorod, 603087

R. Gorev

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: mironov@ipmras.ru
Ресей, Nizhny Novgorod, 603087

O. Ermolaeva

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: mironov@ipmras.ru
Ресей, Nizhny Novgorod, 603087

N. Gusev

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: mironov@ipmras.ru
Ресей, Nizhny Novgorod, 603087

Yu. Petrov

St. Petersburg State University

Email: mironov@ipmras.ru
Ресей, St. Petersburg, 194034

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