Influence of neutron irradiation on etching of SiC in KOH
- Авторлар: Mokhov E.N.1, Kazarova O.P.1, Soltamov V.A.1, Nagalyuk S.S.1
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Мекемелер:
- Ioffe Institute
- Шығарылым: Том 62, № 7 (2017)
- Беттер: 1119-1121
- Бөлім: Experimental Instruments and Technique
- URL: https://journal-vniispk.ru/1063-7842/article/view/199741
- DOI: https://doi.org/10.1134/S1063784217070143
- ID: 199741
Дәйексөз келтіру
Аннотация
The effect of reactor neutron irradiation on the etch rate of SiC in potassium hydroxide has been studied. In the case of high irradiation doses (1019–1021 cm–2), the etch rate of silicon carbide has been shown to drastically rise, especially in the [0001]Si direction. This considerably mitigates the orientation anisotropy of polar face etching. After high-temperature annealing (up to 1200–1400°C), a higher etch rate of irradiated crystals persists. The results have been explained by the high concentration of radiation-induced (partially clustered) defects they contain.
Авторлар туралы
E. Mokhov
Ioffe Institute
Хат алмасуға жауапты Автор.
Email: mokhov@mail.ioffe.ru
Ресей, Politekhnicheskaya ul. 26, St. Petersburg, 184021
O. Kazarova
Ioffe Institute
Email: mokhov@mail.ioffe.ru
Ресей, Politekhnicheskaya ul. 26, St. Petersburg, 184021
V. Soltamov
Ioffe Institute
Email: mokhov@mail.ioffe.ru
Ресей, Politekhnicheskaya ul. 26, St. Petersburg, 184021
S. Nagalyuk
Ioffe Institute
Email: mokhov@mail.ioffe.ru
Ресей, Politekhnicheskaya ul. 26, St. Petersburg, 184021
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