Determination of subpixel microdisplacements of speckle structure using the phase shift of spatial spectrum field

Abstract

An experimental method for measurement of subpixel microdisplacements of speckle structure based on the parameters of the linear phase shift in the field of the complex spatial spectrum of the displaced structure is proposed and experimentally implemented. The phase shift is determined when a phase shift of spectrum is numerically added and the correlation analysis of the resulting linear phase shift in the spatial spectrum of specklegrams is performed. The method provides additional possibilities in the measurements using digital speckle photography when the period of interference fringes formed in the total spatial spectrum of specklegrams is significantly greater than the spectral width.