IR Spectroscopy for Precision Monitoring of Iron and Chromium Impurity Diffusion Profiles in Zinc Chalcogenides
- Авторлар: Kotereva T.V.1, Ikonnikov V.B.1, Gavrishchuk E.M.1, Potapov A.M.1, Savin D.V.1
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Мекемелер:
- Devyatykh Institute of Chemistry of High-Purity Substances
- Шығарылым: Том 63, № 7 (2018)
- Беттер: 1079-1083
- Бөлім: Experimental Instruments and Technique
- URL: https://journal-vniispk.ru/1063-7842/article/view/201766
- DOI: https://doi.org/10.1134/S1063784218070204
- ID: 201766
Дәйексөз келтіру
Аннотация
A technique for precision rapid nondestructive monitoring of the dopant behavior in zinc chalcogenide–based laser media is reported. Results suggest that it is possible to determine the concentration profiles of Fe2+ and Cr2+ dopant ions in zinc chalcogenide by IR spectroscopy combined with an IR microscope in the concentration rage 5 × 1017–2.5 × 1020 atoms/cm3 with a spatial resolution of several micrometers. The diffusion profiles of dopants have been taken for zinc chalcogenide codoped by several impurities.
Авторлар туралы
T. Kotereva
Devyatykh Institute of Chemistry of High-Purity Substances
Хат алмасуға жауапты Автор.
Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950
V. Ikonnikov
Devyatykh Institute of Chemistry of High-Purity Substances
Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950
E. Gavrishchuk
Devyatykh Institute of Chemistry of High-Purity Substances
Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950
A. Potapov
Devyatykh Institute of Chemistry of High-Purity Substances
Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950
D. Savin
Devyatykh Institute of Chemistry of High-Purity Substances
Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950
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