IR Spectroscopy for Precision Monitoring of Iron and Chromium Impurity Diffusion Profiles in Zinc Chalcogenides


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Abstract

A technique for precision rapid nondestructive monitoring of the dopant behavior in zinc chalcogenide–based laser media is reported. Results suggest that it is possible to determine the concentration profiles of Fe2+ and Cr2+ dopant ions in zinc chalcogenide by IR spectroscopy combined with an IR microscope in the concentration rage 5 × 1017–2.5 × 1020 atoms/cm3 with a spatial resolution of several micrometers. The diffusion profiles of dopants have been taken for zinc chalcogenide codoped by several impurities.

About the authors

T. V. Kotereva

Devyatykh Institute of Chemistry of High-Purity Substances

Author for correspondence.
Email: kotereva@ihps.nnov.ru
Russian Federation, Nizhny Novgorod, 903950

V. B. Ikonnikov

Devyatykh Institute of Chemistry of High-Purity Substances

Email: kotereva@ihps.nnov.ru
Russian Federation, Nizhny Novgorod, 903950

E. M. Gavrishchuk

Devyatykh Institute of Chemistry of High-Purity Substances

Email: kotereva@ihps.nnov.ru
Russian Federation, Nizhny Novgorod, 903950

A. M. Potapov

Devyatykh Institute of Chemistry of High-Purity Substances

Email: kotereva@ihps.nnov.ru
Russian Federation, Nizhny Novgorod, 903950

D. V. Savin

Devyatykh Institute of Chemistry of High-Purity Substances

Email: kotereva@ihps.nnov.ru
Russian Federation, Nizhny Novgorod, 903950

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