IR Spectroscopy for Precision Monitoring of Iron and Chromium Impurity Diffusion Profiles in Zinc Chalcogenides


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Аннотация

A technique for precision rapid nondestructive monitoring of the dopant behavior in zinc chalcogenide–based laser media is reported. Results suggest that it is possible to determine the concentration profiles of Fe2+ and Cr2+ dopant ions in zinc chalcogenide by IR spectroscopy combined with an IR microscope in the concentration rage 5 × 1017–2.5 × 1020 atoms/cm3 with a spatial resolution of several micrometers. The diffusion profiles of dopants have been taken for zinc chalcogenide codoped by several impurities.

Авторлар туралы

T. Kotereva

Devyatykh Institute of Chemistry of High-Purity Substances

Хат алмасуға жауапты Автор.
Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950

V. Ikonnikov

Devyatykh Institute of Chemistry of High-Purity Substances

Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950

E. Gavrishchuk

Devyatykh Institute of Chemistry of High-Purity Substances

Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950

A. Potapov

Devyatykh Institute of Chemistry of High-Purity Substances

Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950

D. Savin

Devyatykh Institute of Chemistry of High-Purity Substances

Email: kotereva@ihps.nnov.ru
Ресей, Nizhny Novgorod, 903950

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