Electrostatic Friction Force on an AFM Probe Moving Near a Sample Surface
- Авторлар: Dedkov G.V.1, Kanametov A.A.1
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Мекемелер:
- Kabardino-Balkarian State University
- Шығарылым: Том 63, № 11 (2018)
- Беттер: 1553-1559
- Бөлім: Theoretical and Mathematical Physics
- URL: https://journal-vniispk.ru/1063-7842/article/view/202229
- DOI: https://doi.org/10.1134/S1063784218110075
- ID: 202229
Дәйексөз келтіру
Аннотация
Within the framework of nonrelativistic electrodynamics, general formulas have been obtained for the tangential dissipative force of electrostatic friction and the normal attraction force of an axially symmetric probe moving parallel to a smooth surface of homogeneous substrates or substrates coated with thin films upon various combinations of materials. As a numerical example, the interaction of a metal sphere moving above a metal surface has been studied. The calculation results are compared with the available experimental and theoretical results of other authors.
Авторлар туралы
G. Dedkov
Kabardino-Balkarian State University
Хат алмасуға жауапты Автор.
Email: gv_dedkov@mail.ru
Ресей, Nalchik, 360004
A. Kanametov
Kabardino-Balkarian State University
Хат алмасуға жауапты Автор.
Email: kanametov_a@mail.ru
Ресей, Nalchik, 360004
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