SmS/SiC Heterostructure and Its Associated Thermovoltaic Effect


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Abstract

A heterostructure based on single-crystal SiC and a polycrystalline SmS thin film has been studied. In the temperature interval 300–456 K, the thermovoltaic effect has been measured in the structure, the amount of which reaches ~12 mV at 456 K. It has been shown that the amount of this effect correlates with its concentration model developed earlier.

About the authors

V. V. Kaminskii

Ioffe Institute

Author for correspondence.
Email: VladimirKaminski@gmail.ioffe.ru
Russian Federation, St. Petersburg, 194021

A. O. Lebedev

Ioffe Institute; St. Petersburg State Electrotechnical University LETI

Email: VladimirKaminski@gmail.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 197376

S. M. Solov’ev

Ioffe Institute

Email: VladimirKaminski@gmail.ioffe.ru
Russian Federation, St. Petersburg, 194021

N. V. Sharenkova

Ioffe Institute

Email: VladimirKaminski@gmail.ioffe.ru
Russian Federation, St. Petersburg, 194021

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