X-Ray Computer Methods for Studying the Structural Integrity of Seeds and Their Importance in Modern Seed Science


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Abstract

X-ray computer methods of research (projection microfocus radiography and microtomography), which are used to study the problem of hidden defects of seeds and investigate its impact on sowing quality, have been considered. The description and main characteristics of technical means that were used to obtain digital two-dimensional and three-dimensional (tomographic) X-ray images of seeds have been given and the possible ways of their quantitative computer processing and analysis have been discussed. Conclusions about the abilities of the methods of projection microfocus radiography and microtomography to study the features of the internal structures of a seed that are related to the violation of its integrity have been formulated.

About the authors

M. V. Arkhipov

Agrophysical Research Institute; Northwest Center of Interdisciplinary Studies of Food Supply and Problems

Email: prini@mail.ru
Russian Federation, St. Petersburg, 195220; PushkinSt. Petersburg, 196608

N. S. Priyatkin

Agrophysical Research Institute

Author for correspondence.
Email: prini@mail.ru
Russian Federation, St. Petersburg, 195220

L. P. Gusakova

Agrophysical Research Institute

Email: prini@mail.ru
Russian Federation, St. Petersburg, 195220

N. N. Potrakhov

St. Petersburg Electrotechnical University LETI

Email: prini@mail.ru
Russian Federation, St. Petersburg, 197376

A. Yu. Gryaznov

St. Petersburg Electrotechnical University LETI

Email: prini@mail.ru
Russian Federation, St. Petersburg, 197376

V. B. Bessonov

St. Petersburg Electrotechnical University LETI

Email: prini@mail.ru
Russian Federation, St. Petersburg, 197376

A. V. Obodovskii

St. Petersburg Electrotechnical University LETI

Email: prini@mail.ru
Russian Federation, St. Petersburg, 197376

N. E. Staroverov

St. Petersburg Electrotechnical University LETI

Email: prini@mail.ru
Russian Federation, St. Petersburg, 197376

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