Total External Reflection of X Rays from Polycrystal Solid Surface
- 作者: Stozharov V.M.1, Pronin V.P.1
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隶属关系:
- Gertsen State Pedagogical University
- 期: 卷 62, 编号 12 (2017)
- 页面: 1899-1902
- 栏目: Physical Electronics
- URL: https://journal-vniispk.ru/1063-7842/article/view/200440
- DOI: https://doi.org/10.1134/S1063784217120246
- ID: 200440
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详细
Total external reflection of X rays from surfaces of several polycrystalline metals is analyzed. The roentgenograms of total reflection and X-ray diffraction are comprehensively studied for nickel, copper, silver, platinum, and bismuth. Theoretical processing of experimental roentgenograms is used to calculate Xray refractive indices, number of surface crystallites, interplane distances, and remaining quantities for polycrystalline metals. It is shown that the refractive index inversely depends on the interplane distance in crystallites of polycrystalline solids. Total reflection of X rays from the lead zirconate titanate ferroelectric film is studied.
作者简介
V. Stozharov
Gertsen State Pedagogical University
编辑信件的主要联系方式.
Email: qut1111@yandex.ru
俄罗斯联邦, St. Petersburg, 191186
V. Pronin
Gertsen State Pedagogical University
Email: qut1111@yandex.ru
俄罗斯联邦, St. Petersburg, 191186
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