The temperature dependence of the characteristics of crystalline-silicon-based heterojunction solar cells
- Authors: Sachenko A.V.1, Kryuchenko Y.V.1, Kostylyov V.P.1, Korkishko R.M.1, Sokolovskyi I.O.1, Abramov A.S.2, Abolmasov S.N.2, Andronikov D.A.2, Bobyl’ A.V.3, Panaiotti I.E.3, Terukov E.I.2,3, Titov A.S.3, Shvarts M.Z.3
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Affiliations:
- Lashkaryov Institute of Semiconductor Physics
- R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute
- Ioffe Physical Technical Institute
- Issue: Vol 42, No 3 (2016)
- Pages: 313-316
- Section: Article
- URL: https://journal-vniispk.ru/1063-7850/article/view/198172
- DOI: https://doi.org/10.1134/S1063785016030305
- ID: 198172
Cite item
Abstract
Temperature dependences of the photovoltaic characteristics of (p)a-Si/(i)a-Si:H/(n)c-Si singlecrystalline- silicon based heterojunction-with-intrinsic-thin-layer (HIT) solar cells have been measured in a temperature range of 80–420 K. The open-circuit voltage (VOC), fill factor (FF) of the current–voltage (I–U) characteristic, and maximum output power (Pmax) reach limiting values in the interval of 200–250 K on the background of monotonic growth in the short-circuit current (ISC) in a temperature range of 80–400 K. At temperatures below this interval, the VOC, FF, and Pmax values exhibit a decrease. It is theoretically justified that a decrease in the photovoltaic energy conversion characteristics of solar cells observed on heating from 250 to 400 K is related to exponential growth in the intrinsic conductivity. At temperatures below 200 K, the I–U curve shape exhibits a change that is accompanied by a drop in VOC. Possible factors that account for the decrease in VOC, FF, and Pmax are considered.
About the authors
A. V. Sachenko
Lashkaryov Institute of Semiconductor Physics
Author for correspondence.
Email: sach@isp.kiev.ua
Ukraine, Kyiv, 03028
Yu. V. Kryuchenko
Lashkaryov Institute of Semiconductor Physics
Email: sach@isp.kiev.ua
Ukraine, Kyiv, 03028
V. P. Kostylyov
Lashkaryov Institute of Semiconductor Physics
Email: sach@isp.kiev.ua
Ukraine, Kyiv, 03028
R. M. Korkishko
Lashkaryov Institute of Semiconductor Physics
Email: sach@isp.kiev.ua
Ukraine, Kyiv, 03028
I. O. Sokolovskyi
Lashkaryov Institute of Semiconductor Physics
Email: sach@isp.kiev.ua
Ukraine, Kyiv, 03028
A. S. Abramov
R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Russian Federation, St. Petersburg, 194064
S. N. Abolmasov
R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Russian Federation, St. Petersburg, 194064
D. A. Andronikov
R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Russian Federation, St. Petersburg, 194064
A. V. Bobyl’
Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Russian Federation, St. Petersburg, 194021
I. E. Panaiotti
Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Russian Federation, St. Petersburg, 194021
E. I. Terukov
R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute; Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Russian Federation, St. Petersburg, 194064; St. Petersburg, 194021
A. S. Titov
Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Russian Federation, St. Petersburg, 194021
M. Z. Shvarts
Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Russian Federation, St. Petersburg, 194021
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