Mechanisms of Current Transfer in Electrodeposited Layers of Submicron Semiconductor Particles


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Current–voltage (IV) characteristics of conductance in multigrain layers of submicron particles of silicon, gallium arsenide, indium arsenide, and indium antimonide have been studied. Nanoparticles of all semiconductors were obtained by processing initial single crystals in a ball mill and applied after sedimentation onto substrates by means of electrodeposition. Detailed analysis of the IV curves of electrodeposited layers shows that their behavior is determined by the mechanism of intergranular tunneling emission from near-surface electron states of submicron particles. Parameters of this emission process have been determined. The proposed multigrain semiconductor structures can be used in gas sensors, optical detectors, IR imagers, etc.

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N. Zhukov

Ref-SVET Company

编辑信件的主要联系方式.
Email: ndzhukov@rambler.ru
俄罗斯联邦, Saratov, 410033

D. Mosiyash

Ref-SVET Company

Email: ndzhukov@rambler.ru
俄罗斯联邦, Saratov, 410033

I. Sinev

Saratov State University

Email: ndzhukov@rambler.ru
俄罗斯联邦, Saratov, 410012

A. Khazanov

Ref-SVET Company

Email: ndzhukov@rambler.ru
俄罗斯联邦, Saratov, 410033

A. Smirnov

Saratov State University

Email: ndzhukov@rambler.ru
俄罗斯联邦, Saratov, 410012

I. Lapshin

State Research and Design Institute of the Rare Metal Industry

Email: ndzhukov@rambler.ru
俄罗斯联邦, Moscow, 119017

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