Email this article Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO2/Si(001)
- Authors: Balashev V.V.1,2, Ermakov K.S.2, Chebotkevich L.A.2, Korobtsov V.V.1,2
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Affiliations:
- Institute of Automation and Control Processes, Far Eastern Branch
- School of Natural Sciences
- Issue: Vol 44, No 7 (2018)
- Pages: 595-598
- Section: Article
- URL: https://journal-vniispk.ru/1063-7850/article/view/207783
- DOI: https://doi.org/10.1134/S1063785018070040
- ID: 207783
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Abstract
Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of ~6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.
About the authors
V. V. Balashev
Institute of Automation and Control Processes, Far Eastern Branch; School of Natural Sciences
Author for correspondence.
Email: balashev@mail.dvo.ru
Russian Federation, Vladivostok, 690041; Vladivostok, 690090
K. S. Ermakov
School of Natural Sciences
Email: balashev@mail.dvo.ru
Russian Federation, Vladivostok, 690090
L. A. Chebotkevich
School of Natural Sciences
Email: balashev@mail.dvo.ru
Russian Federation, Vladivostok, 690090
V. V. Korobtsov
Institute of Automation and Control Processes, Far Eastern Branch; School of Natural Sciences
Email: balashev@mail.dvo.ru
Russian Federation, Vladivostok, 690041; Vladivostok, 690090
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