电邮这篇文章 Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO2/Si(001)
- 作者: Balashev V.V.1,2, Ermakov K.S.2, Chebotkevich L.A.2, Korobtsov V.V.1,2
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隶属关系:
- Institute of Automation and Control Processes, Far Eastern Branch
- School of Natural Sciences
- 期: 卷 44, 编号 7 (2018)
- 页面: 595-598
- 栏目: Article
- URL: https://journal-vniispk.ru/1063-7850/article/view/207783
- DOI: https://doi.org/10.1134/S1063785018070040
- ID: 207783
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详细
Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of ~6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.
作者简介
V. Balashev
Institute of Automation and Control Processes, Far Eastern Branch; School of Natural Sciences
编辑信件的主要联系方式.
Email: balashev@mail.dvo.ru
俄罗斯联邦, Vladivostok, 690041; Vladivostok, 690090
K. Ermakov
School of Natural Sciences
Email: balashev@mail.dvo.ru
俄罗斯联邦, Vladivostok, 690090
L. Chebotkevich
School of Natural Sciences
Email: balashev@mail.dvo.ru
俄罗斯联邦, Vladivostok, 690090
V. Korobtsov
Institute of Automation and Control Processes, Far Eastern Branch; School of Natural Sciences
Email: balashev@mail.dvo.ru
俄罗斯联邦, Vladivostok, 690041; Vladivostok, 690090
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