Singularities of Silicon Surface Nanostructuring due to Ultrafast Heating in Water by a Femtosecond Laser Pulse


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Abstract

Silicon surface morphology induced by a femtosecond laser pulse at near-threshold fluences in water environment is investigated by means of atomic-force microscopy (AFM). With increasing fluence, the silicon surface transforms into nanoscale ring-shaped and blister structures, as well as smooth and nanostructured microcraters with a minimum depth of 1 nm. The formation of starlike patterns imprinted at the surface of microcraters at fluences above the ablation threshold is observed.

About the authors

S. A. Romashevskiy

Joint Institute for High Temperatures of the Russian Academy of Sciences

Author for correspondence.
Email: sa.romashevskiy@gmail.com
Russian Federation, Moscow, 125412

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