The Influence of an Amorphous Silicon Layer on the Adsorption Properties of a Semiconductor Structure under Photostimulation Conditions


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Abstract

The photostimulated adsorption of glucose oxidase (GOx) on the surface of single-crystalline Si wafers with an amorphous silicon (a-Si) layer was examined. Estimation of the difference between the surface coverage by GOx molecules deposited under illumination and in the dark showed that this value increased for the structures with a-Si layer by a factor of 2.5 in the case of n-Si and by a factor of 1.5 in the case of p-Si. It is revealed that the n-Si/a-Si structures can be used for preliminary photostimulation of the GOx adsorption  process.

About the authors

S. V. Stetsyura

Saratov State University

Author for correspondence.
Email: Stetsyurasv@mail.ru
Russian Federation, Saratov, 410012

A. V. Kozlowski

Saratov State University

Email: Stetsyurasv@mail.ru
Russian Federation, Saratov, 410012

D. M. Mitin

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: Stetsyurasv@mail.ru
Russian Federation, St. Petersburg, 194021

A. A. Serdobintsev

Saratov State University

Email: Stetsyurasv@mail.ru
Russian Federation, Saratov, 410012

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