Characteristics of a Silicon Avalanche Photodiode for the Near-IR Spectral Range


Citar

Texto integral

Acesso aberto Acesso aberto
Acesso é fechado Acesso está concedido
Acesso é fechado Somente assinantes

Resumo

The sensitivity at wavelengths in the range 400–1150 nm, dark current, and dynamic characteristics of an silicon avalanche photodiode with an active region 1.5 mm in diameter that we developed have been examined. It has been shown that the avalanche photodiode has the following set of characteristics: sensitivity 80–85 A/W at wavelengths of 900–1010 nm, dark current 1.5 nA, and leading and trailing edges shorter than 2.5 ns at a reverse bias voltage of 350 V.

Sobre autores

P. Aruev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

B. Ber

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

A. Gorokhov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

V. Zabrodskii

Ioffe Physical Technical Institute, Russian Academy of Sciences

Autor responsável pela correspondência
Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

D. Kazantsev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

A. Nikolaev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

V. Filimonov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

M. Shvarts

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

E. Sherstnev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
Rússia, St. Petersburg

Arquivos suplementares

Arquivos suplementares
Ação
1. JATS XML

Declaração de direitos autorais © Pleiades Publishing, Ltd., 2019