Автор туралы ақпарат

Yunin, P. A.

Шығарылым	Бөлім	Атауы	Файл
Том 42, № 3 (2016)	Article	Nonlinear calibration curves in secondary ion mass spectrometry for quantitative analysis of gesi heterostructures with nanoclusters
Том 42, № 5 (2016)	Article	Pyrolytic deposition of nanostructured titanium carbide coatings on the surface of multiwalled carbon nanotubes
Том 42, № 6 (2016)	Article	A study of planar structures formed on the modified Al₂O₃ surfaces determining the topology of superconducting elements during YBa₂Cu₃O_7–d deposition
Том 42, № 8 (2016)	Article	Extremely deep profiling analysis of the atomic composition of thick (>100 μm) GaAs layers within power PIN diodes by secondary ion mass spectrometry
Том 43, № 5 (2017)	Article	Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry
Том 44, № 4 (2018)	Article	New Cluster Secondary Ions for Quantitative Analysis of the Concentration of Boron Atoms in Diamond by Time-of-Flight Secondary-Ion Mass Spectrometry
Том 44, № 4 (2018)	Article	A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam
Том 44, № 10 (2018)	Article	The Gas-Phase Synthesis of a New Functional Hybrid Material on the Basis of Multiwalled Carbon Nanotubes Decorated with Faceted Aluminum Nanocrystals