BaTiO3/LaSrMnO3 Heterostructure Grown on Sapphire for Ferroelectric Tunneling Junctions


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Аннотация

BaTiO3/LaSrMnO3 (BTO/LSMO) structures with a ferroelectric layer thickness of 10 nm have been formed on r-cut sapphire substrate by means of high-frequency magnetron sputtering. Investigations of the sample structure showed the presence of a crystalline phase, while measurements of electrical properties revealed piezoelectric response of the BTO films. The study of local current–voltage characteristics showed dependence of the sample resistance on the prehistory of voltage application as determined by ferroelectric hysteresis of the BTO layer.

Авторлар туралы

A. Gagarin

St. Petersburg Electrotechnical University LETI

Хат алмасуға жауапты Автор.
Email: AGGagarin@gmail.com
Ресей, St. Petersburg, 197376

A. Tumarkin

St. Petersburg Electrotechnical University LETI

Email: AGGagarin@gmail.com
Ресей, St. Petersburg, 197376

E. Sapego

St. Petersburg Electrotechnical University LETI

Email: AGGagarin@gmail.com
Ресей, St. Petersburg, 197376

T. Kunkel’

Peter the Great St. Petersburg Polytechnic University; Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: AGGagarin@gmail.com
Ресей, St. Petersburg, 195251; St. Petersburg, 194021

V. Stozharov

The Herzen State Pedagogical University of Russia

Email: AGGagarin@gmail.com
Ресей, St. Petersburg, 191186

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