Thermal lithography of thin films of vanadium dioxide
- Autores: Andreev V.N.1, Klimov V.A.1, Kompan M.E.1
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Afiliações:
- Ioffe Physical Technical Institute
- Edição: Volume 42, Nº 1 (2016)
- Páginas: 19-22
- Seção: Article
- URL: https://journal-vniispk.ru/1063-7850/article/view/196701
- DOI: https://doi.org/10.1134/S1063785016010028
- ID: 196701
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Resumo
A technique is proposed for making microareas with sharply different optical and electrical properties in thin films of vanadium dioxide. The technique is based on vacuum annealing of thin films, which results in a yield of oxygen from vanadium dioxide with the formation of an oxygen vacancy in it.
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Sobre autores
V. Andreev
Ioffe Physical Technical Institute
Email: v.klimov@mail.ioffe.ru
Rússia, St. Petersburg, 194021
V. Klimov
Ioffe Physical Technical Institute
Autor responsável pela correspondência
Email: v.klimov@mail.ioffe.ru
Rússia, St. Petersburg, 194021
M. Kompan
Ioffe Physical Technical Institute
Email: v.klimov@mail.ioffe.ru
Rússia, St. Petersburg, 194021
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