Model describing microwave semiconductor device burnout under the action of a periodic sequence of electric pulses

Abstract

A numerical model, as well as a simpler analytical one, which describe heat accumulation in microwave semiconductor devices exposed to high-power electric-pulse trains, are constructed. Conditions are estabtished under which heat is accumulated with each subsequent pulse up to the onset of a catastrophic failure caused by the device burnout. It demonstrated that short-pulse trains with a small pulse period-topulse duration ratio are most dangerous.