Email this article Magneto-optical methods for analysis of nanothick magnetodielectric films
- Authors: Balabanov D.E.1,2, Kotov V.A.1,2, Shavrov V.G.1, Vasiliev M.2, Alameh K.3
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Affiliations:
- Institute of Radio Engineering and Electronics
- Moscow Institute of Physics and Technology
- Electronics Engineering and ICT Research Center
- Issue: Vol 62, No 1 (2017)
- Pages: 78-82
- Section: Nanoelectronics
- URL: https://journal-vniispk.ru/1064-2269/article/view/197909
- DOI: https://doi.org/10.1134/S106422691701003X
- ID: 197909
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Abstract
An original design of a compensation magnetic system is suggested and implemented: it enables one to measure the difference signal by placing in the measuring device a film on a paramagnetic device and the original paramagnetic substrate, thereby providing the full compensation of the paramagnetic substrate.
About the authors
D. E. Balabanov
Institute of Radio Engineering and Electronics; Moscow Institute of Physics and Technology
Email: kotov.slava@gmail.com
Russian Federation, Moscow, 125009; Dolgoprudnyi, Moscow oblast, 141700
V. A. Kotov
Institute of Radio Engineering and Electronics; Moscow Institute of Physics and Technology
Author for correspondence.
Email: kotov.slava@gmail.com
Russian Federation, Moscow, 125009; Dolgoprudnyi, Moscow oblast, 141700
V. G. Shavrov
Institute of Radio Engineering and Electronics
Email: kotov.slava@gmail.com
Russian Federation, Moscow, 125009
M. Vasiliev
Moscow Institute of Physics and Technology
Email: kotov.slava@gmail.com
Russian Federation, Dolgoprudnyi, Moscow oblast, 141700
K. Alameh
Electronics Engineering and ICT Research Center
Email: kotov.slava@gmail.com
Australia, Joondalup, WA 6027
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