Dielectric Loss in the Polymer–Semiconductor–Composite System with Allowance for Nonlinear Dependence of Electric Characteristics on Temperature Resulting from Microwave Irradiation
- Authors: Kuznetsov G.V.1, Kravchenko E.V.1, Pribaturin N.A.2
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Affiliations:
- Tomsk Polytechnic University
- Institute of Thermal Physics, Siberian Branch
- Issue: Vol 63, No 4 (2018)
- Pages: 381-387
- Section: Radio Phenomena in Solids and Plasma
- URL: https://journal-vniispk.ru/1064-2269/article/view/199703
- DOI: https://doi.org/10.1134/S106422691804006X
- ID: 199703
Cite item
Abstract
An electrothermophysical model that makes it possible to estimate dielectric loss and predict energy-dissipation characteristics in dielectric materials is proposed. Heat and mass transfer is numerically simulated in the presence of microwave irradiation of an electronic device (polymer–semiconductor–composite system) with allowance for local heat liberation and nonlinear dependence of dielectric characteristics on temperature. Distributions of permittivity and tangent of dielectric loss with respect to thickness of the system under study are presented for a typical interval of variations in the parameters of electromagnetic radiation. It is demonstrated that dissipation of electromagnetic energy leads to a significant (by a factor of 1.6) increase in the tangent of dielectric loss.
About the authors
G. V. Kuznetsov
Tomsk Polytechnic University
Email: kevatp@tpu.ru
Russian Federation, Tomsk, 634050
E. V. Kravchenko
Tomsk Polytechnic University
Author for correspondence.
Email: kevatp@tpu.ru
Russian Federation, Tomsk, 634050
N. A. Pribaturin
Institute of Thermal Physics, Siberian Branch
Email: kevatp@tpu.ru
Russian Federation, Novosibirsk, 630090
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