Implementation of the TDA Digital Mode on a ROIC for Scanning IR FPA

Abstract

In this paper, we present the results of the development of a readout integrated circuit for scanning infrared focal plane arrays with digital time delay and accumulation processing. The accumulation and digital processing of a photocurrent on the readout integrated circuit chip allows increasing a signal-to-noise ratio and improving the weight-dimensional characteristics of the infrared focal plane arrays. The feasibility of implementing the digital time delay and accumulation mode on conveyor architecture that is a digital analog of devices with charge communication is substantiated. The advantages of conveyor architecture, such as smaller channel pitch and lower power consumption, are noted. The results of testing the readout integrated circuit in a 1024 × 10 digital time delay and accumulation mode with a pitch of 15 μm and 12-bit serial code output digital signals are presented.