Email this article Taking into Account the Features of a Tunneling Microscope Control for Interpreting Measurements
- Authors: Kartashev V.A.1, Kartashev V.V.1
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Affiliations:
- Keldysh Institute of Applied Mathematics
- Issue: Vol 57, No 5 (2018)
- Pages: 784-788
- Section: Image Processing
- URL: https://journal-vniispk.ru/1064-2307/article/view/220217
- DOI: https://doi.org/10.1134/S1064230718050064
- ID: 220217
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Abstract
An algorithm for interpreting the results of measurements made by a tunneling microscope that takes into account the specific features of the microscope control is studied. Conditions under which the model of the nanotopography constructed based on the measurements exactly reproduces the original surface are derived. The features of nanotopography that cannot be reproduced using the proposed interpretation techniques are described.
About the authors
V. A. Kartashev
Keldysh Institute of Applied Mathematics
Email: kart@list.ru
Russian Federation, Moscow, 125047
V. V. Kartashev
Keldysh Institute of Applied Mathematics
Author for correspondence.
Email: kart@list.ru
Russian Federation, Moscow, 125047
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