Internal Quantum Efficiency of Led Structures at Various Charge Carrier Distributions Over InGaN/GaN Quantum Wells
- 作者: Romanov I.S.1, Prudaev I.A.1, Kopyev V.V.1
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隶属关系:
- National Research Tomsk State University
- 期: 卷 61, 编号 2 (2018)
- 页面: 211-215
- 栏目: Article
- URL: https://journal-vniispk.ru/1064-8887/article/view/240136
- DOI: https://doi.org/10.1007/s11182-018-1387-5
- ID: 240136
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详细
The results of studying the effect of the thickness of GaN barrier layers in the active region of LED structures with InGaN/GaN quantum wells on the internal quantum efficiency (IQE) of photoluminescence are presented. It is shown that a decrease in the thickness of the GaN barrier layers from 15 to 3 nm leads to an increase in the maximum value of IQE and to a shift of the maximum to the region of high excitation powers. The result obtained is explained with consideration for the decrease in the Auger recombination rate due to a more uniform distribution of charge carriers over the active region in structures with a barrier thickness of 3 nm.
作者简介
I. Romanov
National Research Tomsk State University
编辑信件的主要联系方式.
Email: rff.romis@gmail.com
俄罗斯联邦, Tomsk
I. Prudaev
National Research Tomsk State University
Email: rff.romis@gmail.com
俄罗斯联邦, Tomsk
V. Kopyev
National Research Tomsk State University
Email: rff.romis@gmail.com
俄罗斯联邦, Tomsk
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