Electrical Properties of Sn-Excess SnTe Single Crystal and Metal-Semiconductor Contacts

Abstract

The paper deals with the grown tin telluride (SnTe) single crystals сontaining extrinsic stacking faults (SFs) and their alloyed ohmic contacts of the 57Bi–43Sn eutectic alloy in the temperature range of 77–300 K. It is found that at a low concentration, SFs decrease the hole concentration and increase the electrical resistivity of specimens when they occupy vacancies in the Sn sublattice. At a high concentration, SFs create new current carriers, thereby decreasing the specific resistance of specimens. The ohmic contact resistance is rather low, and the current flows mainly through metallic shunts.