Email this article Wavelet Signal Processing for Resolution Enhancement in a Recurrence Tracking Microscope
- Authors: Akhtar N.1, Ullah H.2, al Omari A.3, Saif F.2,3,4
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Affiliations:
- Hefei National Laboratory for Physical Sciences Microscale University of Science and Technology of China Hefei
- Department of Electronics, Quaid-i-Azam University
- Department of Physics, Jerash University
- Department of Physics, Quaid-i-Azam University
- Issue: Vol 38, No 5 (2017)
- Pages: 399-407
- Section: Article
- URL: https://journal-vniispk.ru/1071-2836/article/view/248226
- DOI: https://doi.org/10.1007/s10946-017-9660-6
- ID: 248226
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Abstract
Based on continuous wavelet transform (CWT), we show that the resolution of a recurrence tracking microscope (RTM) is enhanced to subnanometer scale. Our approach helps us to read information on frequency bands, time of revivals, and corresponding time of fractional revivals more accurately. We demonstrate that wavelet analysis provides a deeper information on the phenomena of quantum recurrences in general. Our analytical results show very good agreement with numerical results based on experimental parameters.
About the authors
Naeem Akhtar
Hefei National Laboratory for Physical Sciences Microscale University of Science and Technology of China Hefei
Email: farhan.saif@fullbrightmail.org
China, Anhui, 230026
Hayat Ullah
Department of Electronics, Quaid-i-Azam University
Email: farhan.saif@fullbrightmail.org
Pakistan, Islamabad, 45320
Aiman al Omari
Department of Physics, Jerash University
Email: farhan.saif@fullbrightmail.org
Jordan, Jerash
Farhan Saif
Department of Electronics, Quaid-i-Azam University; Department of Physics, Jerash University; Department of Physics, Quaid-i-Azam University
Author for correspondence.
Email: farhan.saif@fullbrightmail.org
Pakistan, Islamabad, 45320; Jerash; Islamabad, 45320
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