Study of melting processes in semicrystalline polymers using a combination of ultrafast chip calorimetry and nanofocus synchrotron X-ray diffraction

Abstract

This work is devoted to the development and application of a new experimental method that combines in situ ultrafast calorimetry on a chip with nanofocus synchrotron X-ray diffraction. In the present work, this method is used to study the melting mechanisms of samples of semicrystalline polymers with the mass of a few tens of nanograms. Such studies are relevant when working with materials that are characterized by complex phase behavior, for example, prone to transitions into metastable states or demonstrating fast processes of structural adjustment during thermal treatment.