Elaboration of THz Surface Plasmon Spectroscopy Method
- Авторлар: Zhizhin GN1, Nikitin AK1, Loginov AP2, Golovtsov NI2, Ryjova TA3
-
Мекемелер:
- Scientific and Technological Center for Unique Instrumentation, RAS
- Peoples Friendship University of Russia
- Российского университета дружбы народов
- Шығарылым: № 1 (2008)
- Беттер: 54-65
- Бөлім: Articles
- URL: https://journal-vniispk.ru/2658-4670/article/view/329016
- ID: 329016
Дәйексөз келтіру
Толық мәтін
Аннотация
range (30-100 сm 1 or 0.1-10 THz) utilizing free-electron laser (FEL) radiation is described
in the paper. The following issues are considered in it: 1) methods for THz SP excitation by
bulk radiation, as well as the ways of measuring their characteristics; 2) experimental results
on THz SP excitation on aluminum and copper surfaces by FEL radiation with wavelength of
110 and 150 m; 3) the procedure for the sample material THz dielectric constant calculation
using the measured SP complex refractive index; 4) a number of methods implementing THz
SP spectroscopy technique.
Авторлар туралы
G Zhizhin
Scientific and Technological Center for Unique Instrumentation, RASScientific and Technological Center for Unique Instrumentation, RAS
A Nikitin
Scientific and Technological Center for Unique Instrumentation, RASScientific and Technological Center for Unique Instrumentation, RAS
A Loginov
Peoples Friendship University of RussiaКафедра общей физики; Российского университета дружбы народов; Peoples Friendship University of Russia
N Golovtsov
Peoples Friendship University of RussiaКафедра общей физики; Российского университета дружбы народов; Peoples Friendship University of Russia
T Ryjova
Российского университета дружбы народовКафедра общей физики; Российского университета дружбы народов
Қосымша файлдар
