Email this article Determination of X-Ray Beam Characteristics from the Secondary Radiation Field Profile
- Authors: Lelyukhin A.S.1
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Affiliations:
- Orenburg State University
- Issue: Vol 53, No 2 (2019)
- Pages: 121-124
- Section: Article
- URL: https://journal-vniispk.ru/0006-3398/article/view/236068
- DOI: https://doi.org/10.1007/s10527-019-09890-4
- ID: 236068
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Abstract
A new method for determining the anode voltage and the total filtration of X-ray diagnostic devices from the profile of secondary radiation fields is proposed. Secondary radiation fields are excited near a composite scattering body made of materials with different absorption properties. It is shown that the asymmetry coefficient and the lower quartile of the experimentally recorded distributions can be used as measurement criteria.
About the authors
A. S. Lelyukhin
Orenburg State University
Author for correspondence.
Email: alex-ray@inbox.ru
Russian Federation, Orenburg
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