The Determining Role of the (HF2) Ion in the Formation of Pores in Silicon in Its Electrochemical Etching with Hydrofluoric Acid Solutions


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Abstract

A model of the chemical interaction of Si with the (HF2) ion was propsoed to explain some experimental data on the formation of porous silicon.

About the authors

E. N. Abramova

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Russian Federation, Moscow, 119571

A. M. Khort

Institute of Fine Chemical Technologies

Author for correspondence.
Email: anavenko@yandex.ru
Russian Federation, Moscow, 119571

A. G. Yakovenko

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Russian Federation, Moscow, 119571

E. A. Slipchenko

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Russian Federation, Moscow, 119571

D. S. Kornilova

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Russian Federation, Moscow, 119571

M. V. Tsygankova

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Russian Federation, Moscow, 119571

V. I. Shvets

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Russian Federation, Moscow, 119571

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