电邮这篇文章 Single Fault Diagnostic Tests for Inversion Faults of Circuit Elements Over Some Bases
- 作者: Lyubich I.G.1, Romanov D.S.1
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隶属关系:
- Lomonosov Moscow State University
- 期: 卷 30, 编号 1 (2019)
- 页面: 36-47
- 栏目: Article
- URL: https://journal-vniispk.ru/1046-283X/article/view/247823
- DOI: https://doi.org/10.1007/s10598-019-09432-3
- ID: 247823
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详细
The article shows that, in a number of bases, every Boolean function can be realized by an irredundant combinational circuit that admits a single fault diagnostic test of length not greater than 4 with respect to inversion faults on the element outputs.
作者简介
I. Lyubich
Lomonosov Moscow State University
编辑信件的主要联系方式.
Email: lubi4ig@gmail.com
俄罗斯联邦, Moscow
D. Romanov
Lomonosov Moscow State University
Email: lubi4ig@gmail.com
俄罗斯联邦, Moscow
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