Enviar artigo por via de e-mail On a defect identification method based on monitoring the structure and peculiarities of surface wave fields
- Autores: Bocharova O.V.1, Sedov A.V.1, Andzhikovich I.E.1, Kalinchuk V.V.1
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Afiliações:
- Southern Scientific Center of the Russian Academy of Sciences
- Edição: Volume 52, Nº 7 (2016)
- Páginas: 377-382
- Seção: Acoustic Methods
- URL: https://journal-vniispk.ru/1061-8309/article/view/181159
- DOI: https://doi.org/10.1134/S1061830916070020
- ID: 181159
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Resumo
A special technique is proposed for processing detected signals. The technique uses an adjustable orthonormal basis and makes it possible to effectively identify defects by monitoring the structure and peculiarities of surface wave fields.
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Sobre autores
O. Bocharova
Southern Scientific Center of the Russian Academy of Sciences
Autor responsável pela correspondência
Email: olga.v.bocharova@gmail.com
Rússia, Rostov-on-Don, 344006
A. Sedov
Southern Scientific Center of the Russian Academy of Sciences
Email: olga.v.bocharova@gmail.com
Rússia, Rostov-on-Don, 344006
I. Andzhikovich
Southern Scientific Center of the Russian Academy of Sciences
Email: olga.v.bocharova@gmail.com
Rússia, Rostov-on-Don, 344006
V. Kalinchuk
Southern Scientific Center of the Russian Academy of Sciences
Email: olga.v.bocharova@gmail.com
Rússia, Rostov-on-Don, 344006
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