Email this article On a defect identification method based on monitoring the structure and peculiarities of surface wave fields
- Authors: Bocharova O.V.1, Sedov A.V.1, Andzhikovich I.E.1, Kalinchuk V.V.1
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Affiliations:
- Southern Scientific Center of the Russian Academy of Sciences
- Issue: Vol 52, No 7 (2016)
- Pages: 377-382
- Section: Acoustic Methods
- URL: https://journal-vniispk.ru/1061-8309/article/view/181159
- DOI: https://doi.org/10.1134/S1061830916070020
- ID: 181159
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Abstract
A special technique is proposed for processing detected signals. The technique uses an adjustable orthonormal basis and makes it possible to effectively identify defects by monitoring the structure and peculiarities of surface wave fields.
About the authors
O. V. Bocharova
Southern Scientific Center of the Russian Academy of Sciences
Author for correspondence.
Email: olga.v.bocharova@gmail.com
Russian Federation, Rostov-on-Don, 344006
A. V. Sedov
Southern Scientific Center of the Russian Academy of Sciences
Email: olga.v.bocharova@gmail.com
Russian Federation, Rostov-on-Don, 344006
I. E. Andzhikovich
Southern Scientific Center of the Russian Academy of Sciences
Email: olga.v.bocharova@gmail.com
Russian Federation, Rostov-on-Don, 344006
V. V. Kalinchuk
Southern Scientific Center of the Russian Academy of Sciences
Email: olga.v.bocharova@gmail.com
Russian Federation, Rostov-on-Don, 344006
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