Application of Empirical Si–O–C Potential to Simulate Amorphous Atomic Structures and Transition Layers by the Bond Switching Method
- Authors: Belov I.V.1
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Affiliations:
- National Research Centre “Kurchatov Institute”
- Issue: Vol 64, No 4 (2019)
- Pages: 662-668
- Section: Nanomaterials and Ceramics
- URL: https://journal-vniispk.ru/1063-7745/article/view/194151
- DOI: https://doi.org/10.1134/S1063774519040059
- ID: 194151
Cite item
Abstract
The parameters of REBO2 empirical potential for the Si–O–C system are presented. The results of the calculations using this potential agree well with the experimental values of the lengths and angles of unit cells, bond energy, and surface energy for Si, SiO2, and SiC. The algorithm of bond switching in a multicomponent system has been developed and tested. A method is proposed to simulate the structure of the transition layer between crystalline Si and amorphous SiO2, as well as between crystalline SiC and amorphous SiO2.
About the authors
I. V. Belov
National Research Centre “Kurchatov Institute”
Author for correspondence.
Email: ivanbelov1977@gmail.com
Russian Federation, pl. Akademika Kurchatova 1, Moscow, 123182
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