Автор туралы ақпарат
Khramov, E. V.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 52, № 16 (2018) | 26th INTERNATIONAL SYMPOSIUM “NANOSTRUCTURES: PHYSICS AND TECHNOLOGY”. NANOSTRUCTURE CHARACTERIZATION | XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Si | |
| Том 53, № 16 (2019) | Nanostructures Technology | XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Quartz |