作者的详细信息
Vikulin, I. M.
| 期 | 栏目 | 标题 | 文件 |
| 卷 50, 编号 9 (2016) | Physics of Semiconductor Devices | On methods of determining the band gap of semiconductor structures with p–n junctions | |
| 卷 51, 编号 10 (2017) | Physics of Semiconductor Devices | Degradation of the parameters of transistor temperature sensors under the effect of ionizing radiation |