Автор туралы ақпарат
Presnyakov, R. V.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 52, № 2 (2018) | Fabrication, Treatment, and Testing of Materials and Structures | Electrical Activity of Extended Defects in Multicrystalline Silicon | |
| Том 53, № 1 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Dependence of the Bulk Electrical Properties of Multisilicon on the Grain Misorientation Parameters |