Informaçao sobre o Autor
Bryzgalov, V. V.
| Edição | Seção | Título | Arquivo |
| Volume 52, Nº 5 (2018) | XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Characterization | Composition and Band Structure of the Native Oxide Nanolayer on the Ion Beam Treated Surface of the GaAs Wafer | |
| Volume 52, Nº 16 (2018) | 26th INTERNATIONAL SYMPOSIUM “NANOSTRUCTURES: PHYSICS AND TECHNOLOGY”. NANOSTRUCTURE CHARACTERIZATION | Сomposition Depth Profiling of the GaAs Native Oxide Irradiated by an Ar+ Ion Beam |