Informaçao sobre o Autor
Budaragin, V. V.
Edição | Seção | Título | Arquivo |
Volume 50, Nº 8 (2016) | Fabrication, Treatment, and Testing of Materials and Structures | Estimation of the efficiency of the introduction of a porous layer into a silicon-on-sapphire structure substrate to enhance the reliability of devices under irradiation |