Автор туралы ақпарат
Mikhlin, Yu. L.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 50, № 3 (2016) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Layer-by-Layer Analysis of the Thickness Distribution of Silicon Dioxide in the Structure SiO2/Si(111) by Inelastic Electron Scattering Cross-Section Spectroscopy |