Dielectric Relaxation in Thin Layers of the Ge28.5Pb15S56.5 Glassy System

Resumo

The results of studying dielectric relaxation processes in the Ge_28.5Pb₁₅S_56.5 glassy system are presented. The existence of the non-Debye relaxation process caused by the distribution of relaxors over the relaxation time according to the Cole–Cole model is revealed. The energy and structural parameters are calculated: the activation energy E_p = 0.40 eV and the molecular dipole moment μ = 1.08 D. The detected features are explained within the model according to which the chalcogenide-glass structure is a set of dipoles formed by charged defects such as D⁺ and D^–.