Enviar artigo por via de e-mail Low-Frequency Dielectric Relaxation in Iron-Doped Ge28.5Pb15S56.5 Glassy System
- Autores: Castro R.A.1, Grabko G.I.2, Kononov A.A.1
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Afiliações:
- Herzen State Pedagogical University of Russia
- Transbaikal State University
- Edição: Volume 52, Nº 9 (2018)
- Páginas: 1160-1162
- Seção: Amorphous, Vitreous, and Organic Semiconductors
- URL: https://journal-vniispk.ru/1063-7826/article/view/204032
- DOI: https://doi.org/10.1134/S1063782618090051
- ID: 204032
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Resumo
The dielectric relaxation processes in Ge28.5Pb15S56.5 glassy system are investigated. The introduction of an iron impurity into a glass matrix is shown to sharply increase the permittivity ε' and decrease the dissipation factor tanδ. The found regularities are explained within the cluster structure (two-phase) model of doped glass.
Sobre autores
R. Castro
Herzen State Pedagogical University of Russia
Autor responsável pela correspondência
Email: recastro@mail.ru
Rússia, St. Petersburg, 191186
G. Grabko
Transbaikal State University
Email: recastro@mail.ru
Rússia, Chita, 672039
A. Kononov
Herzen State Pedagogical University of Russia
Email: recastro@mail.ru
Rússia, St. Petersburg, 191186
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