Density Control of InP/GaInP Quantum Dots Grown by Metal-Organic Vapor-Phase Epitaxy
- Авторы: Lebedev D.V.1, Kalyuzhnyy N.A.1, Mintairov S.A.1, Belyaev K.G.1, Rakhlin M.V.1, Toropov A.A.1, Brunkov P.1,2, Vlasov A.S.1, Merz J.3, Rouvimov S.3, Oktyabrsky S.4, Yakimov M.4, Mukhin I.V.5, Shelaev A.V.6, Bykov V.A.6, Romanova A.Y.2, Buryak P.A.2, Mintairov A.M.1,3
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Учреждения:
- Ioffe Institute
- St. Petersburg Polytechnical University
- University of Notre Dame
- Institute for Materials
- St. Petersburg Academic University
- NT-MDT Spectrum Instruments
- Выпуск: Том 52, № 4 (2018)
- Страницы: 497-501
- Раздел: XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, June 26–30, 2017. Quantum Wells, Quantum Wires, Quantum Dots, and Band Structure
- URL: https://journal-vniispk.ru/1063-7826/article/view/202852
- DOI: https://doi.org/10.1134/S1063782618040206
- ID: 202852
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Аннотация
We investigated structural and emission properties of self-organized InP/GaInP quantum dots (QD) grown by metal organic chemical vapor deposition using an amount of deposited In from 7 to 2 monolayers (ML). In the uncapped samples, using atomic force microscopy (AFM), we observed lateral sizes of 100–200 nm, together with a bimodal height distribution having maxima at ∼5 and ∼15 nm, which we denoted as QDs of type A and B, respectively; and reduction of the density of the type-B dots from 4.4 to 1.6 μm–2. The reduction of the density of B-type dots were observed also using transmission electron microscopy of the capped samples. Using single dot low-temperature photoluminescence (PL) spectroscopy we demonstrated effects of Wigner localization for the electrons accumulated in these dots.
Об авторах
D. Lebedev
Ioffe Institute
Автор, ответственный за переписку.
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021
N. Kalyuzhnyy
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021
S. Mintairov
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021
K. Belyaev
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021
M. Rakhlin
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021
A. Toropov
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021
P. Brunkov
Ioffe Institute; St. Petersburg Polytechnical University
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021; St. Petersburg, 195251
A. Vlasov
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021
J. Merz
University of Notre Dame
Email: Lebedev.dmitri@mail.ioffe.ru
США, Notre Dame, IN, 46556
S. Rouvimov
University of Notre Dame
Email: Lebedev.dmitri@mail.ioffe.ru
США, Notre Dame, IN, 46556
S. Oktyabrsky
Institute for Materials
Email: Lebedev.dmitri@mail.ioffe.ru
США, Albany, NY, 12203
M. Yakimov
Institute for Materials
Email: Lebedev.dmitri@mail.ioffe.ru
США, Albany, NY, 12203
I. Mukhin
St. Petersburg Academic University
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021
A. Shelaev
NT-MDT Spectrum Instruments
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, Zelenograd, 124460
V. Bykov
NT-MDT Spectrum Instruments
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, Zelenograd, 124460
A. Romanova
St. Petersburg Polytechnical University
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 195251
P. Buryak
St. Petersburg Polytechnical University
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 195251
A. Mintairov
Ioffe Institute; University of Notre Dame
Email: Lebedev.dmitri@mail.ioffe.ru
Россия, St. Petersburg, 194021; Notre Dame, IN, 46556
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