Impact ionization in nonuniformly heated silicon p+–n–n+ and n+–p–p+ structures
- Авторлар: Musaev A.M.1
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Мекемелер:
- Amirkhanov Institute of Physics, Dagestan Scientific Center
- Шығарылым: Том 50, № 4 (2016)
- Беттер: 462-465
- Бөлім: Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena
- URL: https://journal-vniispk.ru/1063-7826/article/view/196976
- DOI: https://doi.org/10.1134/S1063782616040175
- ID: 196976
Дәйексөз келтіру
Аннотация
Experimental results on the effects of changes in the impact-ionization current in silicon diffusion p+–n–n+ and n+–p–p+ structures upon nonuniform heating are presented. It is shown that the revealed effects are associated with the transformation of band energy levels caused by thermoelastic stresses of the structures.
Авторлар туралы
A. Musaev
Amirkhanov Institute of Physics, Dagestan Scientific Center
Хат алмасуға жауапты Автор.
Email: akhmed-musaev@yandex.ru
Ресей, ul. Yaragskogo 94, Makhachkala, 367003
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