Structural and optical properties of single and bilayer silver and gold films
- Авторы: Yankovskii G.M.1,2, Komarov A.V.1,3, Puz’ko R.S.1,3, Baryshev A.V.1,3,4, Afanas’ev K.N.1,5,6, Boginskaya I.A.1,5,6, Bykov I.V.1,5,6, Merzlikin A.M.1,3,5, Rodionov I.A.1,6, Ryzhikov I.A.1,5,6
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							Учреждения: 
							- Dukhov All-Russia Research Institute of Automatics
- MISiS National University of Science and Technology
- Moscow Institute of Physics and Technology (State University)
- Ioffe Institute
- Institute for Theoretical and Applied Electrodynamics
- Bauman Moscow State Technical University
 
- Выпуск: Том 58, № 12 (2016)
- Страницы: 2503-2510
- Раздел: Optical Properties
- URL: https://journal-vniispk.ru/1063-7834/article/view/199362
- DOI: https://doi.org/10.1134/S1063783416120349
- ID: 199362
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Аннотация
An experimental study of structural and optical properties of silver and gold thin films, as well as bilayer films based on these metals, has been carried out. To study properties of nanofilms, reflection spectra upon excitation of surface plasmons in the Kretschmann geometry and spectra of ellipsometric parameters have been investigated. The reflection spectra were analyzed using a theoretical model for determining (effective) dielectric constants of the films. The calculated dielectric constants of the films differ from data obtained by ellipsometry. The features in determining dielectric constants by different methods and characteristics of manufactured films in relation to the influence of the substrate are discussed.
Об авторах
G. Yankovskii
Dukhov All-Russia Research Institute of Automatics; MISiS National University of Science and Technology
							Автор, ответственный за переписку.
							Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; Leninskii pr. 4, Moscow, 119049						
A. Komarov
Dukhov All-Russia Research Institute of Automatics; Moscow Institute of Physics and Technology (State University)
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700						
R. Puz’ko
Dukhov All-Russia Research Institute of Automatics; Moscow Institute of Physics and Technology (State University)
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700						
A. Baryshev
Dukhov All-Russia Research Institute of Automatics; Moscow Institute of Physics and Technology (State University); Ioffe Institute
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700; Politekhnicheskaya ul. 26, St. Petersburg, 194021						
K. Afanas’ev
Dukhov All-Russia Research Institute of Automatics; Institute for Theoretical and Applied Electrodynamics; Bauman Moscow State Technical University
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; ul. Izhorskaya 13, Moscow, 125412; Vtoraya Baumanskaya ul. 5, Moscow, 107005						
I. Boginskaya
Dukhov All-Russia Research Institute of Automatics; Institute for Theoretical and Applied Electrodynamics; Bauman Moscow State Technical University
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; ul. Izhorskaya 13, Moscow, 125412; Vtoraya Baumanskaya ul. 5, Moscow, 107005						
I. Bykov
Dukhov All-Russia Research Institute of Automatics; Institute for Theoretical and Applied Electrodynamics; Bauman Moscow State Technical University
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; ul. Izhorskaya 13, Moscow, 125412; Vtoraya Baumanskaya ul. 5, Moscow, 107005						
A. Merzlikin
Dukhov All-Russia Research Institute of Automatics; Moscow Institute of Physics and Technology (State University); Institute for Theoretical and Applied Electrodynamics
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700; ul. Izhorskaya 13, Moscow, 125412						
I. Rodionov
Dukhov All-Russia Research Institute of Automatics; Bauman Moscow State Technical University
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; Vtoraya Baumanskaya ul. 5, Moscow, 107005						
I. Ryzhikov
Dukhov All-Russia Research Institute of Automatics; Institute for Theoretical and Applied Electrodynamics; Bauman Moscow State Technical University
														Email: gyankovskii@mail.ru
				                					                																			                												                	Россия, 							ul. Sushchevskaya 22, Moscow, 127055; ul. Izhorskaya 13, Moscow, 125412; Vtoraya Baumanskaya ul. 5, Moscow, 107005						
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