Valence transition investigation in the O2–Yb–Si(111) system by means of the angle-resolved photoelectron spectroscopy method
- Authors: Kuz’min M.V.1, Mittsev M.A.1
- 
							Affiliations: 
							- Ioffe Institute
 
- Issue: Vol 59, No 10 (2017)
- Pages: 2058-2062
- Section: Surface Physics, Thin Films
- URL: https://journal-vniispk.ru/1063-7834/article/view/201306
- DOI: https://doi.org/10.1134/S1063783417100250
- ID: 201306
Cite item
Abstract
Investigations of the Yb–Si(111) and O2–Yb–Si(111) structures are carried out by means of the angle-resolved photoelectron spectroscopy method, and data about distribution of two- and three-valence ions in ytterbium nanofilms are obtained in the case when an adsorbed molecules layer on their surface is not fully formed yet, and Yb2+ → Yb3+ valence transition is not completed. It is shown that distribution of Yb2+ and Yb3+ ions deep into the nanofilms is close to isotropic, and that its spread is 9 or more monolayers. The obtained results indicate that all atoms of the nanofilm participate in formation of the ytterbium 5d band, stimulated by adsorbed molecules, confirming assumptions made in earlier publications.
About the authors
M. V. Kuz’min
Ioffe Institute
							Author for correspondence.
							Email: m.kuzmin@mail.ioffe.ru
				                					                																			                												                	Russian Federation, 							St. Petersburg, 194021						
M. A. Mittsev
Ioffe Institute
														Email: m.kuzmin@mail.ioffe.ru
				                					                																			                												                	Russian Federation, 							St. Petersburg, 194021						
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